Measurement Request

Overview

Based on Meter-Lab. Inc.’s core technologies, we provide test services for various challenging issues related to thickness/surface profile/distance measurement utilizing our own measurement equipment. A complimentary service is possible for one-time test, but multiple sample test for R&D purpose may cost a modest service fee.

Thickness

Shape

Distance

Material
Classification

Previous Research Cases

• Semiconductor
  
  1. SOI wafer & Interposer thickness

  t-Nova-1550TN
  2. Multilayer conformal thin film thickness

  t-Nova-525R
  3. PCB 3D surface shape

  t-Nova-850H
  4. TSV·TGV depth in semiconductor packaging

  t-Nova-1550R
  5. Ultra-high precision position

  t-Nova-1550-60
• Secondary Battery
  
  1. Thickness & surface shape of conformal coating in secondary batteries

  t-Nova-850R
  2. Multilayer tomography

  t-Nova-850H
  3. Keyhole depth in laser welding

  t-Nova-840-60
• Display
  
  1. OLED thin film thickness

  t-Nova-525R
  2. Large bare glass substrate thickness

  t-Nova-1550TN
  3. Conformal coating layer thickness

  s-Nova-850H
  4. Flexible glass substrate thickness

  s-Nova-575H
  5. Micro-LED chromaticity

  s-Nova-575H
• R&D
  
  1. Aerospace – 10 m level long distance

  t-Nova-1550-60
  2. Defense – Large optics mirror’s high reflectance

  Cavity ring-down spectroscopy (CRDS)
  3. Absolute distance with quantum-limited resolution

  s-Nova-1550
  4. Imaging beyond the diffraction limit

  Fourier ptychography
  5. Thin film thickness & refractive index analysis based on AI

  t-Nova-525R, t-Nova-1550