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Measuring DLC coating thickness that reduces surface wear and degradation

Attending and Presenting at the 9th Precision Metrology Workshop

Semiconductor Flux Thickness Distribution Measurement

Holds Precision Optical Metrology Seminar at the University of Arizona — Draws Many Astronomy Resea

[Demonstration] 3D Surface Profile Measurement of Step Height Certified Reference Materials

[Demonstration] Ultra-Thin Glass and Film Thickness Distribution Measurement

[Demonstration] Large Glass Substrate Thickness Measurement

[Demonstration] Multilayer Thin-Film Thickness Measurement

[Demonstration] Multi-Channel Glass Thickness Measurement

[Products] High-Speed, High-Resolution Spectrometer: s-Nova-850

[Products] High-Resolution Hyperspectrometer: s-Nova-H Series

[Demonstration] Simultaneous Measurement of Thickness and Refractive Index