Intellectual Property Rights

[The 8th Precision Measurement Workshop] Real-Time Multichannel In-Process Inspection Technology Using High-Resolution Hyperspectral Techniques

Approaching the Quantum-Limited Precision in Frequency-Comb-based Spectral Interferometric Ranging

Realizing Quantum-Limit-Level Precision with an Optical-Comb-based Spectral-Domain Interferometer

[The 32th Korean Conference on Semiconductors] High-Speed Thickness and Shape Measurement Technology based on Hyperspectral Interferometry for Advanced Semiconductor and Display Manufacturing Proc

Thin Film Thickness Analysis Using a Deep Learning Algorithm with Consideration of Reflectance Fluctuations

Research on Deep-Learning Algorithm for Thin-Film Thickness Measurement Reflecting Measurement Envir

[2024 Autumn Conference of the Korean Society for Precision Engineering] Uncertainty Evaluation of Multilayer Thin-Film Thickness Measurement Using Spectroscopic Reflectometry

[2024 Autumn Conference of the Korean Society for Precision Engineering] High-Speed Thickness and Shape Measurement Technology based on a Hyperspectral Camera

[2024 Autumn Conference of the Korean Society for Precision Engineering] Performance Improvement of a Deep Learning Algorithm for Thin-Film Thickness Analysis Considering Reflectance Fluctuations

[2024 CLEO-PR (Cleo Pacific Rim)] An optical measuring method for three-dimensional surface profile