Intellectual Property Rights

[2025 Autumn Conference of the Korean Society for Precision Engineering] Application of a Deep Learning–based Analysis Method for Thin-Film Thickness Measurement on Rough Surfaces

[2025 Autumn Conference of the Korean Society for Precision Engineering] layer-by-layer Thickness Measurement of Multilayer Films for Smart Devices

[2025 Autumn Conference of the Korean Society for Precision Engineering] Uncertainty Analysis of Spectral Interferometry for Ensuring the Reliability of Precision Optical Thickness Measurements

[IMID 2025 ] layer-resolved measurement of thickness and refractive index in a triple-layer protective film using spectral interference method

[IMID 2025] Refractive Index and Thickness Measurement of the Internal Adhesive layer in Touchscreens based on Spectroscopic Reflectometry

[2025 Spring Conference of the Korean Society for Precision Engineering] Thickness and Refractive Index Measurement of Molded Optical Lenses Using Precision Spectral Interferometry

[2025 Spring Conference of the Korean Society for Precision Engineering] Refractive Index Measurement of the Adhesive layer in Touchscreen Panel Glass Using a Spectral Reflectometer

[2025 Spring Conference of the Korean Society for Precision Engineering] Hyperspectral-based Multichannel Thickness Measurement for Advanced Display Manufacturing Processes

[The 8th Precision Measurement Workshop] Real-Time Thin-Film Thickness Measurement Deep Learning Algorithm Considering Measurement Environments

[The 8th Precision Measurement Workshop] Real-Time Surface Shape Measurement Technology Using High-Resolution Hyperspectral Techniques