On October 23, Dr. Jonghan Jin (CTO and Chief R&D Officer) delivered a technical seminar titled “Spectroscopic Reflectometry and Spectral Interferometry for Advanced Manufacturing Processes” at the University of Arizona, a leading U.S. university in the field of optics. The seminar lasted approximately 1 hour and 30 minutes and was met with strong interest from numerous researchers in optics and precision measurement.
The presentation covered the principles of spectral interferometry and the design and fabrication of spectrometers, and it introduced Meterlab’s various ongoing research activities and real-world industrial applications. He shared a range of technical approaches and application results, including thickness and distance measurements using high-speed spectrometers, thickness profiling and three-dimensional shape measurements based on hyperspectral imaging spectrometers, and more. He also presented new research cases aimed at applying Meterlab’s measurement technologies to the operation of large telescopes at U.S. observatories.
An active Q&A session followed the seminar. Participants engaged in in-depth discussions on a wide variety of topics, from basic terminology questions to spectrometer calibration methods, uncertainty evaluation of measurement systems, and the feasibility of applying the techniques in real research-equipment environments. Through this exchange, attendees were able to share research experiences and technical perspectives in a meaningful way. We look forward to continued collaboration and dialogue with measurement specialists both in Korea and abroad.
