Applications

[Demonstration] OLED Thickness Distribution Measurement

[Demonstration] High-Speed Thin-Film Thickness Distribution Measurement

[Demonstration] Real-Time Distance Measurement

Deep Learning-based Thickness Measurement for Rough-Surface Thin Films

Simultaneous Measurement of Thickness, Refractive Index, and 3D Shape of Silicon Wafers

Meter-lab Achieves Ultra-Precise Absolute Distance Measurement for Alignment of the World’s Largest

Innovation to Improve the Accuracy of Radiation Measurement — KRISS’s Development of a 4πβ(PPC)-γ Pr

t-Nova — Precision distance measurement

t-Nova-525R — Measurement of metal and metalloid Thin-Film Thickness

t-Nova-1550R High-Speed Silicon Thickness Profiling

s-Nova-850 Wavelength Calibration Method

t-Nova-1550R for Glass Thickness Measurement — Millimeter (mm) Scale Selection