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Applications
[Demonstration] Silicon Wafer Thickness Profile Measurement
2026.07.06
Applications
[Demonstration] OLED Thickness Distribution Measurement
2026.07.06
Applications
[Demonstration] High-Speed Thin-Film Thickness Distribution Measurement
2026.07.06
Applications
[Demonstration] Real-Time Distance Measurement
2026.07.06
Applications
Deep Learning-ba
sed Thickness Measurement for Rough-Surface Thin Films
2026.05.08
Applications
Simultaneous Measurement of Thickness, Refractive Index, and 3D Shape of Silicon Wafers
2026.05.08
Others
Technical Seminar on Advanced Measurement Technology at NMIJ/AIST
2026.04.27
Others
Invited Talk and Oral Presentations at OPIC-OPTM2026 International Conference
2026.04.27
Others
nanoMan/ICMTE2026 International Conference Held in Seoul
2026.04.16
Others
Meter-Lab Selects Representative Research Achievement for 2025
2025.12.17
Others
Lecture on “The First Step in Measurement” Delivered at the 3rd Precision Measurement Tutorial
2025.12.05
Others
Meter-Lab Seminar on Advanced Measurement Technologies at the University of Arizona
2025.10.23
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![[Demonstration] Silicon Wafer Thickness Profile Measurement](/uploaded/board/news_en/t_XJzyrHGk2k4.jpg)
![[Demonstration] OLED Thickness Distribution Measurement](/uploaded/board/news_en/t_whcIrqNMoKA.jpg)
![[Demonstration] High-Speed Thin-Film Thickness Distribution Measurement](/uploaded/board/news_en/t_WDyqI0j35j8.jpg)
![[Demonstration] Real-Time Distance Measurement](/uploaded/board/news_en/t_mqTYxBXVqek.jpg)
