The nanoMan/ICMTE2026 international conference was successfully held from April 12 to 15, 2026, at the ST Center in Seoul, bringing together leading experts and innovators from around the world.
MeterLab actively participated in the event by operating an exhibition booth that showcased its advanced core technologies, including spectroscopy, interferometry, data analytics, and reliability evaluation. Visitors had the opportunity to explore real-world applications of our technologies across key industries such as semiconductors, displays, secondary batteries, and defense/aerospace, highlighting MeterLab’s growing impact in advanced manufacturing.
In the industry session, Principal Researcher Dr. Jaeseok Bae delivered a compelling oral presentation titled “Optical Metrology for Advanced Manufacturing: Our Technologies and Applications.” The presentation introduced MeterLab’s proprietary technologies and demonstrated a cutting-edge solution that integrates AI vision with spectroscopic interferometry. This innovation enables high-speed, in-line defect inspection as well as precise thickness and refractive index measurement of large moving glass substrates—showcasing our commitment to pushing the boundaries of optical metrology.
MeterLab will continue to drive innovation and deliver advanced measurement solutions to support the future of high-tech industries.
