t-Nova-850/1550R
Thin film thickness measurement sensor
Products Non contact thickness sensor t-Nova-850/1550R
- Compact and robust configuration for inline measurements
- High speed measurement
- Easy to use for various industrial applications
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Measurement screen -
Principle -
Reflectance data -
Reflectance data
Specification
| Wavelength range | 750 nm - 950 nmㅤ/ㅤ1490 nm - 1610 nm |
|---|---|
| Thickness measurement resolution | 10 nm (or 0.1 nm) |
| Thickness measurement range | 400 nm - 1.2 mm / 2 μm - 3 mm |
| Maximum Measurement speed | 250 kHz / 40 kHz |
| Measurement principles | Spectral-domain inteterferometry, Spectroscopic reflectometry |
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