s-Nova-850
High-speed spectrometer enabling ultra-fast thickness measurement
Products Spectrometer s-Nova-850
- Various applications can be applied through VIS ~ NIR spectrum measurement
- External devices can be linked through various external interfaces
- Provides dedicated library and technical support for programming (C++, C#, LabVIEW)
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External structure -
Internal structure -
Optical path -
Spectrum
Specification
| Wavelength range | 750 nm - 950 nm |
|---|---|
| Wavelength bandwidth | Approximately 200 nm |
| Wavelength accuracy | 0.1 nm |
| Measurement speed | 250 kHz (Maximum) |
| Pixel number | 2048 pixels |
| Input port type | FC/APC, FC/APC, SMA |
| PC Interface | Camera Link, USB 3.0 |
| Dimensions | 129.5 mm x 240 mm x 78 mm |
| Weight | 2.5 kg |
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INQUIRY
1107, 114, Gyeryong-ro, Yuseong-gu, Daejeon, Republic of Korea
TEL : +82-70-7122-2000 FAX : +82-70-7159-1353 E-MAIL : info@meter-lab.com
TEL : +82-70-7122-2000 FAX : +82-70-7159-1353 E-MAIL : info@meter-lab.com
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