본문 바로가기 주메뉴 바로가기

Products Non contact thickness sensor t-Nova-850/1550TN
t-Nova-850/1550TN

Ultrafast thickness measurement sensor

  • Simultaneous measurement of physical thickness and refractive index
  • Vibration insensitive measurement
  • High speed and High precision measurement
  • Wide applicability to various substrate materials (Glass, Silicon wafer, etc.)
INQUIRY
+ 82-70-7122-2000
Online Inquiry





  • External structure





  • Measurement





  • Measurement





  • Measurement

Specification

Specifications
Wavelength range 750 nm - 950 nmㅤ/ㅤ1490 nm - 1610 nm
Thickness measurement resolution <10 nm, Refractive index : 10^-3
Thickness measurement range (General glass) 6 μm - 1.2 mm / 20 μm - 3 mm
Maximum Measurement speed 250 kHz / 40 kHz
Measuring tolerance angle <±5º
Measurement principle Spectral-domain interferometry
Standard specimen KRISS standard thickness specimen provided

Download

Catalogue
Detailed Product Information
Download
Drawing
Detailed Product Darwing and CAD file
Download
Manual
Downloadable product Manual
Download
SDK
Downloadable Product Software Development Kit
Download
Firmware
Download Latest Product Firmware
Download

상단으로